A Good Design leads to the next solution with the least application level issues. We are efficient designers, micro-architects, RTL integrators providing quality results reducing verification cycles for TTM.
We embrace your design and apply the best regression test solution.This is necessary so that it can adapt to every possible change and scale with different Designs and Architectures.
"Our team undergoes structured trainings for fundamentals. We plan on our training-modules and use the tools to get goal based timing, layout, extracted results with excellent core strength based objectives for the IP and SoC levels HIPs"
Our DFT methodology can provide a complete solution including MBIST, regular scan, AC scan, scan compression, boundary scan (JTAG), power aware test and ATPG to achieve limit tending to a 100% test coverage
"Our experts have successfully implemented various types of analog layouts for different SoCs not only for the Earth applications but also for the RADHARD layouts for space specific ICs"